A Study of Estimating the Technical Efficiency of Optoelectronic Firms: An Application of Data Envelopment Analysis and Tobit Analysis
AUTHORS: Yaw-Shun Yu, Ambrosio Barros, Ming-Lang Yeh, Min-Jer Lu, Chih-Hung Tsai
PAGES: 1-11
International Journal of Academic Research in Business and Social Sciences
Open Access Journal
ISSN: 2222-6990